Measurement and Accountability
AIM Test Window Attendance Collection - March 9th to 26thMonday, March 1, 2010, 10:17 am
The Test Window Attendance Collection is used to collect the aggregate hours and absent counts of all student enrolled at the school as of March 9, 2010. These data will be used as part of the calculations of the attendance rate for AYP.
Instructions for this collection can be found at: http://opi.mt.gov/pub/index.php?dir=AIM/AIM%20Collections/Test%20Window%20Attendance%20Collection/
For more information, contact AIM Help Desk, 406-444-3800